Simultaneous SCE and SCI measurements

ABSTRACT

A color measurement system is provided that includes an integrating sphere having at least one specular component included (SCI) sensor configured to output a signal in response to light incident thereupon and at least one specular component excluded (SCE) sensor configured to output a signal in response to light incident thereupon, a sample port, a SCE port, a light source configured to direct a beam of light into the sphere and provide illumination at the sample port and a specular component excluded port. The system also includes a processor having a memory and configured by code to activate the light source so as to cause a beam of light to be directed into the sphere and provide illumination to the sample port. The processor is also configured to receive a signal output by the SCI sensor and a signal output by the SCE sensor. Furthermore, the processor is configured to obtain at least one measurement coefficient value and generate a corrected SCE measurement value using at least the SCI sensor value, the SCE sensor value and the obtained measurement coefficient. The processor is configured to output at least the corrected SCE measurement value and the SCI measurement value.

FIELD OF THE INVENTION

The present invention is directed to spectrum measurement devices and approaches for obtaining simultaneous specular component included (SCI) and specular component excluded (SCE) measurements for a given sample.

BACKGROUND

It is common in the field of color measurement technology to measure color properties of items. Such measurements are usually done as a part of a quality control or manufacturing process to ensure that the color of items provided are consistent from one product batch to the next.

One approach to color measurement uses integrating spheres to measure the reflectance of color specimen. For example, the Datacolor 800 family of instruments manufactured by Datacolor Inc. of Lawrenceville N.J., are spectrophotometers that incorporate integrating sphere devices to measure the color properties of samples.

When using an integrating sphere, it is possible to measure a sample with or without the specular component of reflection included. Commonly, the specular component included (SCI) and specular component excluded (SCE) parameters are measured separately with the aid of a mechanical specular port cover or baffle, commonly called a SCE port. Efforts have been made to eliminate the need of moving the mechanical port cover and thus enable the measurement of SCI and SCE parameters simultaneously.

For example, in U.S. Pat. No. 6,424,413, titled “Multi-Channel Integrating Sphere”, to Weber et. al., herein incorporated by reference in its entirety, teaches a method of measuring multiple-channel information simultaneously, including SCI and SCE reflectances. However, the Weber patent includes drawbacks that prevent the ready adoption of such technology. Specifically, the ideal SCE port of an integrating sphere is usually fairly large relative to the rest of the integrating sphere. Likewise, the SCI effective area (that is the area of specular reflection) is also equally large. Commonly, and currently, the desire for a large SCE port and a large SCI effective area come into conflict. If both the SCE port and the SCI effective area are maximized and measurements are attempted to be made simultaneously, then the areas will overlap introducing error into the measurements.

As such, without mechanical baffles or port covers, SCI measurements can hardly be made simultaneously with SCE measurement. Furthermore, when designing the SCE port, it becomes difficult to determine how to weigh the desire for maximal port size against the other features (light leakage etc.) that are necessary design considerations to take into account when designing measurement devices in general and integrating spheres in particular. For example, those skilled in the art will appreciate that making the SCE port too big or too small will cause the measurement results to be erroneous. Another drawback of having a large SCE port is that it will impact the efficiency of the integrating sphere due to the light leakage from the SCE port. The bigger the SCE port is, the lower efficiency the integrating sphere will be.

Therefore, what is needed in the art is an integrating sphere having a SCE port sized and located such that the SCE port does not impact the SCI measurements. Furthermore, what is also needed is a SCE port having dimensions such that the SCE parameters can be properly measured at the same time as the SCI parameters.

SUMMARY

In one non-limiting example of the features of the systems and methods described herein, a color measurement system is provided. Here, the color measurement system includes an integrating sphere having at least one specular component included (SCI) sensor configured to output a signal in response to light incident thereupon and at least one specular component excluded (SCE) sensor configured to output a signal in response to light incident thereupon, a sample port, a light source configured to direct a beam of light at the sample port and a specular component excluded port. The system also includes a processor having a memory and configured by code to activate the light source so as to cause a beam of light to be directed to the sample port. The processor is also configured to receive a signal output by the SCI sensor and a signal output by the SCE sensor. Furthermore, the processor is configured to obtain at least one measurement coefficient value and generate a corrected SCE measurement value using at least the SCI sensor value, the SCE sensor value and the obtained measurement coefficient. The processor is configured to output at least the corrected SCE measurement value and the SCI measurement value.

In a further configuration, the system described further includes the processor configured to generate the corrected SCE measurements using a calculation algorithm that corresponds to a weighted combination of SCI signal and SCE signal, wherein the weight coefficient(s) can be obtained by measuring one or more black/gray standards with known SCI and SCE reflectance values.

BRIEF DESCRIPTION OF THE DRAWINGS

The invention is illustrated in the figures of the accompanying drawings which are meant to be exemplary and not limiting, in which like references are intended to refer to like or corresponding parts, and in which:

FIG. 1 illustrates an integrating sphere where both the SCI effective area and the SCE port has been optimized.

FIG. 2 illustrates an integrating sphere according to an embodiment of the present invention.

FIG. 3 presents a block diagram detailing the elements used to implement one embodiment of the present invention.

FIG. 4 presents a flow diagram detailing a SCI and SCE measurement process according to one embodiment of the present invention.

FIG. 5 presents a block diagram detailing the various modules according to one embodiment of the present invention.

FIG. 6 presents a flow diagram detailing a calibration process according to one embodiment of the present invention.

DETAILED DESCRIPTION OF CERTAIN EMBODIMENTS OF THE INVENTION

By way of overview and introduction, and shown in reference to FIG. 1, it is common in the art of color measurement to use integrating spheres that are able to obtain SCE and SCI measurements. Usually, there is a tradeoff between obtaining the largest aperture for the SCE port and obtaining valid SCI measurements. For example, where the SCI effective area is significantly large, it will interfere with the SCE measurement port, thus making simultaneous measurements difficult. The solution to this technical challenge has to be to use a port cover that allows the sequential measurement of both the SCE and the SCI measurements. Since the accuracy of both SCE and SCI measurements both depend on maximizing the size of the SCE Port and the SCI effective area respectively, the result will be that the SCE port and the SCI effective area will overlap, as shown in reference to FIG. 1.

In order to improve on this drawback found in the technology field of integrating spheres, an apparatus, method and system are described herein to measure specular component included (SCI) and specular component excluded (SCE) reflectances for a sample. These measurements are made simultaneously while still maintaining a high degree of accuracy. More specifically, as shown in FIG. 2, an integrating sphere is provided that has a SCE port sized and positioned so as to not overlap with the dimensions of the SCI effective measurement area. Using obtained calibration coefficients, the measurements made using this non-overlapping SCE port can be used along with the SCI measurements to obtain a more accurate measurement of the true SCE value. In one implementation described in more detail herein, the measured SCE signal can be recast as a weighted combination of SCI signal and true (i.e., ideal) SCE signal.

Turning now to FIG. 3, a configuration of elements for an apparatus, system and method for the measurement of the specular component included (SCI) and specular component excluded (SCE) reflectances properties of a sample simultaneously with a SCE specular port that does not impinge on the measurement results of SCI measurements are provided.

In one or more configurations, the system includes an integrating sphere 102. In one or more implementations, the integrating sphere 102 is utilized to obtain color measurements of a sample 103 under analysis. In one implementation, sample 103 is a color swatch, fan deck, color sample, product, item or object. For example, the sample 103 is a piece of material where the color of the material is desired to be known. In another implementation, the sample 103 is any object where the color values of an object are unknown and desired or known and in need of clarification or confirmation.

In one or more implementations, the integrating sphere 102 includes an interior cavity that is defined by an interior surface. The interior of the integrating sphere 102 has a reflective, optically diffuse, surface. In many configurations, the inner surface of the integrating sphere 102 is white and highly reflective. In one particular implementation, the interior of the integrating sphere 102 is coated with materials having a high diffuse reflectance value. For example, in one arrangement materials such as Spectralon®, Teflon® or a similar material is coated or applied to the interior of the integrating sphere 102. In another arrangement, the coating selected is configured to reflect 99% or greater of the incident light directed into the integrating sphere 102 in the wavelengths from 300 nm to 900 nm. In another implementation, the interior of the integrating sphere is coated with a barium sulfate-based paint which possess a lower reflectance relative to Spectralon®.

In the illustrated arrangement of FIG. 3, the integrating sphere 102 includes a light source 110. For example, the integrating sphere 102 includes an aperture that permits light from light source 110 to be directed into the interior cavity of the integrating sphere 102. In a particular configuration, the light source 110 is an incandescent lamp, fluorescent light, infrared light source, or light emitting diode (LED). In a further embodiment, the LED is a high color-rendering-index broadband LED. In a more particular configuration, the light source 110 is any light source is controlled in response to a control signal and produces light. As used throughout, the light source 110 is configured to emit light in pulses or a steady beam. In a further implementation, the light source 110 is equivalent or substantially similar to the light source provide in the Datacolor 800 family of products. The light source 110 is used to illuminate sample 103 in order to provide an analysis of color, light transmission and/or reflective properties.

The integrating sphere in at least one implementation, also includes a SCE sensor 104 and a SCI sensor 106 as shown in FIG. 3. In one or more implementations, either the SCE sensor 104 or the SCI sensor 106 is one or more photometers, light sensing elements, or other similar devices. In a further implementation, the SCE sensor 104 or the SCI sensor 106 is one or more cameras or image acquisition devices such as CMOS (Complementary Metal Oxide Semiconductor), CCD (charged coupled device) or other color measurement devices. Such sensors can include data acquisition devices and associated hardware, firmware and software that is used to generate color values for a given sample. In a further implementation, sensors 104 and 106 are configured to communicate with the associated processors, networks, and storage devices using one or more USB, FIREWIRE, Wi-Fi, GSM, Ethernet, Bluetooth, and other wired or wireless communication technologies suitable for the transmission color, image, spectral, or other relevant data and or metadata. In an alternative arrangement, the color sensors 104 and 106 are modules or components of a computing workstation, testing bench, or other evaluative apparatus.

In the illustrated embodiment, the integrating sphere 102 is equipped with a sample port 112. In one or more configurations, the sample port 112 is configured such that a sample 103 can be placed in close proximity to the sample port 112. In this configuration, the light beam generated by the light source 110 travels unimpeded through the integrating sphere 102 and is incident upon the interior surface of the integrating sphere 102. From there, light that has been incident upon the inner surface of the integrating sphere 102 is eventually incident upon the sample 103. In turn, both the SCE sensor 104 and the SCI sensor 106 are configured to measure light that has been incident upon the sample 103.

In a further configuration, the integrating sphere 102 also includes an SCE port 120. As shown with reference to FIGS. 1 and 2, the dimensions of the SCE port 120 are such that the SCE port 120 does not overlap with the SCI effective area. As such, in one implementation, the SCE port 120 is a circular port. In a further implementation, the SCE port 120 has a diameter that does not overlap with the SCE effective area. For example, the orientation of the SCE port 120 within the integrating sphere 102 is such that the dimensions of the SCE port are less than the idealized or optimal SCE port 120 area, as shown in FIG. 2. As further shown in FIG. 2, the SCE port 120 is positioned in close proximity to the SCI effective area such that were the SCE port 120 to be increased in dimension to the optimal size for SCE measurements, the port SCE port 120 would overlap with the SCI effective area.

In the illustrated arrangement of FIG. 2, the relative dimensions of the SCE port 120 and SCI effective area are shown. However, in alternative arrangements, the relative dimension of the SCE port 120 can be altered or changed based on other considerations or factors as necessary to achieve the purposes and intents of the system described.

In one or more further implementations, the integrating sphere is further equipped with a reference channel measurement device. For example, a reference channel measurement device (not shown) is utilized to compensate for the fluctuations of the light source 110. In one or more implementations, the reference channel sensor is one or more light measurement devices, such as but not limited to, photodiode arrays, CCD sensor elements, CMOS sensor elements or other requisite hardware components commonly used in the art to function as a light reference channel sensor. In one or more configurations, the output of the reference channel measurement device is used to adjust measurements made by the SCI and SCE sensors so as to correct for inherent fluctuations in the light generated by the light source 110.

With further reference to FIG. 3, a processor 114 is communicatively coupled to the light source 110, the SCE sensor 104 and the SCI sensor 106. In one or more implementations, the processor 114 is communicatively coupled directly to each illustrated component. However, in one or more further implementations, the processor 114 is configured to communicate with a bus, hub, interface, or other component that manages the operation of one or more components based on processor 114 instructions.

In one particular implementation, the processor 114 is a computing device, such as a commercially available microprocessor, processing cluster, integrated circuit, computer on chip or other data processing device. In one or more configurations, the processor 114 is one or more components of a cellphone, smartphone, notebook or desktop computer configured to directly, or through a communication linkage, receive color measurement data captured by the SCE sensor 104 and the SCI sensor 106. The processor 114 is configured with code executing therein to access various peripheral devices and network interfaces. For instance, the processor 114 is configured to communicate over the Internet with one or more remote servers, computers, peripherals or other hardware using standard or custom communication protocols and settings (e.g., TCP/IP, etc.).

In one configuration, the processor 114 is a portable computing device such as an Apple iPad/iPhone® or Android® device or other commercially available mobile electronic device executing a commercially available or custom operating system, e.g., MICROSOFT WINDOWS, APPLE OSX, UNIX or Linux based operating system implementations. In other embodiments, the processor 114 is, or includes, custom or non-standard hardware, firmware or software configurations. For instance, the processor 114 comprises one or more of a collection of micro-computing elements, computer-on-chip, home entertainment consoles, media players, set-top boxes, prototyping devices or “hobby” computing elements. The processor 114 can comprise a single processor, multiple discrete processors, a multi-core processor, or other type of processor(s) known to those of skill in the art, depending on the particular embodiment.

In one or more embodiments, the processor 114 is directly or indirectly connected to one or more memory storage devices (memories) to form a microcontroller structure. The memory is a persistent or non-persistent storage device (such as memory 105) that is operative to store the operating system in addition to one or more of software modules. In accordance with one or more embodiments, the memory comprises one or more volatile and non-volatile memories, such as Read Only Memory (“ROM”), Random Access Memory (“RAM”), Electrically Erasable Programmable Read-Only Memory (“EEPROM”), Phase Change Memory (“PCM”), Single In-line Memory (“SIMM”), Dual In-line Memory (“DIMM”) or other memory types. Such memories can be fixed or removable, as is known to those of ordinary skill in the art, such as through the use of removable media cards or modules. In one or more embodiments, the memory of the processor 104 provides for the storage of application program and data files. One or more memories provide program code that the processor 114 reads and executes upon receipt of a start, or initiation signal. The computer memories may also comprise secondary computer memory, such as magnetic or optical disk drives or flash memory, that provide long term storage of data in a manner similar to the persistent memory device 105. In one or more embodiments, the memory 105 of the processor 114 provides for storage of application programs or modules and data files when needed.

As shown, memory 105 and persistent storage 108 are examples of computer-readable tangible storage devices. A storage device is any piece of hardware that is capable of storing information, such as data, program code in functional form, and/or other suitable information on a temporary basis and/or permanent basis. In one or more embodiments, memory 105 includes random access memory (RAM). RAM may be used to store data such as measurement data in accordance with the present invention. In general, memory can include any suitable volatile or non-volatile computer-readable storage device. Software and data are stored in persistent storage 108 for access and/or execution by processors 114 via one or more memories of memory 105.

In a particular embodiment, persistent storage 108 includes a magnetic hard disk drive. Alternatively, or in addition to a magnetic hard disk drive, persistent storage 108 can include a solid state hard drive, a semiconductor storage device, read-only memory (ROM), erasable programmable read-only memory (EPROM), flash memory, or any other computer-readable storage devices capable of storing program instructions or digital information.

The database 108 may be embodied as solid-state memory (e.g., ROM), hard disk drive systems, RAID, disk arrays, storage area networks (“SAN”), network attached storage (“NAS”) and/or any other suitable system for storing computer data. In addition, the database 108 may comprise caches, including database caches and/or web caches. Programmatically, the database 108 may comprise flat-file data store, a relational database, an object-oriented database, a hybrid relational-object database, a key-value data store such as HADOOP or MONGODB, in addition to other systems for the structure and retrieval of data that are well known to those of skill in the art.

The media used by persistent storage 108 may also be removable. For example, a removable hard drive may be used for persistent storage 108. Other examples include optical and magnetic disks, thumb drives, and smart cards that are inserted into a drive for transfer onto another computer-readable storage medium that is also part of persistent storage 108.

Communications or network interface unit 116, in these examples, provides for communications with other sub-systems or devices. In an embodiment, communications interface 116 may provide appropriate interfaces to the Internet or other suitable data communications network to connect to one or more servers, resources, API hosts, or computers. In these examples, communications unit 116 may include one or more network interface cards. Communications unit 116 may provide communications through the use of either or both physical and wireless communications links.

In one or more implementations, the display device 118 is a screen, monitor, display, LED, LCD or OLED panel, augmented or virtual reality interface or an electronic ink-based display device.

Turning to FIGS. 4 and 5, the system illustrated in FIG. 3 is configured to obtain simultaneous measurements of SCE and SCI values for a single sample. As shown in particular detail with respect to FIG. 4, such simultaneous measurement includes the steps of activating one or more light sources or elements 110. As shown in step 202, the processor 114 is configured to cause a light source 110 to activate and direct a beam of light (shown in dashed lines of FIG. 5) to the inner surface of the integrating sphere 102 such that light that has been incident upon the inner surface is then incident upon the sample 103. For example, the processor 114 is configured by a light activation module 302 that causes one or more elements of the light source 110 to be activated and direct a beam of light into the integrating sphere 102 such that the light is incident on a portion of the inner surface of the integrating sphere 102. For instance, one or more submodules of the light activation module 302 configures the processor 114 to generate an activation signal to the light element 110 causing it to activate and generate a beam of light having the desired characteristics. In one particular implementation, the light beam is directed to be incident off of the inner surface of the integrating sphere such that the light incident off the inner surface of the integrating sphere 102 is then incident off of the sample 103 positioned at the sample port 112. In turn, the light is incident off of the sample 103 and is then incident upon both the SCE and SCI sensors.

In one or more particular implementations, the SCE port 120 is in an open position when the light activation module configures the processor 114 to activate the light source 110.

In response to the light being incident upon the sensor elements of the SCE sensor 104 and the SCI sensor 106, both sensors generate an output signal corresponding to the light incident upon the respective sensors. The processor 114 is configured to receive the signal generated by the SCE sensor 104, as in step 204. Here, the processor 114 is configured by the SCI measurement module to receive and classify the signal generated from the SCE sensor 104 as an SCE measurement of the sample 103. For example, one or more measurement values corresponding to the signal generated by the SCE sensor 104 are stored by the processor 114 in the memory 105 or the database 108.

In a further implementation, the processor 114 is configured by a SCI measurement module 306 to store the signal generated by the SCI sensor 106. For example, as shown in step 306 the measurement signal generated by the SCE sensor 106 are received by the processor 114 as in step 206. The processor 114 is further configured categorize, flag, or assign the measurement values received by the processor 114 corresponding to the SCI sensor measurements 106 as SCI measurements in the memory 105 or the database 108.

In one or more further implementations, the SCE measurement module 304 and the SCI measurement module 306 configure the processor 114 to receive one or more measurement values from the SCE 104 and SCI 106 sensors and format or otherwise convert, configure, or alter the form or format of the signal generated by the respective sensors. For example, in one implementation, the respective modules convert the signal output by the respective sensors into a digital file, binary stream, data object, value or data structure.

Turning to step 208, the processor 114 is configured by a coefficient access module 308 to access one or more measurement coefficient values from a data storage location. For example, the one or more submodules of the coefficient access module 308 configures the processor 114 to query the memory or database 108 for one or more coefficient values. By way of non-limiting example, the configured processor 114 initiates a remote connection to database 108 where a collection of coefficient values is stored. Here, the processor 114 is configured by one or more submodules of the coefficient access module 308 to obtain from the remote data storage device the relevant coefficient values. In one particular configuration, the desired or appropriate measurement coefficient values are identified based on user input. In this configuration, the user is able to input the type of material, or another known parameter of the sample 103 and retrieve the appropriate coefficients. In another implementation, where the type of material is known, the coefficient values can be accessed based on prior calibration actions involving a given type of materials.

In yet a further implementation, the coefficient values are derived by first obtaining measurement of a calibration standard using the integrating sphere of the present invention as in step 210. By way of a more detailed explanation and in keeping with the disclosure herein, the processor 114 is configured to obtain measurements of a color calibration standard using the SCE and SCI sensors. As shown in more detail in FIG. 6, the process of generating the coefficient values includes making use of the relationship between measurements made using the actual SCE port and measurements made using an idealized or optimized SCE port. For instance, let I₁ be the signal generated by the SCE sensor 104 upon receiving light from the area within an ideal SCE port but out of the actual SCE port 112 (the white part within the dash circle around the actual SCE port as shown in FIG. 2). Furthermore, let I₂ be the sensor response from the SCE sensor measuring the area of the SCE port if the SCE port were fully covered by a material similar to that of the internal wall of the integrating sphere.

The relationship between I₁ and I₂ can be described according to equation 1: I ₁ =−kI ₂  (1)

It will be appreciated that the relation provided in equation 1 can be sample dependent. For instance, in one implementation, if ceramic tiles are used to calibrate the system, (which is an approach used in the art) the relation of equation 1 remains true for any material having surface properties similar to that of ceramic tiles. As such, the calibration provides a valid anchor for different types of materials.

Furthermore, I₁ can also be described in terms of the relationship between the sensor response of the SCE sensor 104, and I₂ can be described in terms of the SCI sensor 106 measurements. For example, equation 2 provided: I ₁ =I _(SCEM) −I _(SCET)  (2) I ₂ =I _(SCI) −I _(SCEM)  (3)

where I_(SCI) is the SCI signal, I_(SCET) is the true SCE signal if measured with an ideal SCE port, and I_(SCEM) is the measured SCE signal with the actual SCE port 120. As used herein, in the actual SCE port 120 area will have a smaller value than the “ideal” SCE port. As shown in the equations 1-3 above, the actual dimensions of the SCE port relative to the ideal SCE port are not critical so long as the relationship outlined in the forgoing formula are maintained. For example, the anticipated measurement value obtained using the optimized SCE port (I_(SCET)) is described as: I _(SCET) =kI _(SCI)+(1−k)I _(SCEM)  (4)

When we measure reflectance, since R_(SCI)=I_(SCI)/D_(SCI), R_(SCET)=I_(SCET)/D_(SCET), and R_(SCEM)=I_(SCI)/D_(SCEM), where D are the corresponding intensities of a white diffuser, and R are the corresponding reflectances of the sample 103, equation (4) becomes: R _(SCET) D _(SCET) =kR _(SCI) D _(SCI)+(1−k)R _(SCEM) D _(SCEM)  (5)

and thus:

$\begin{matrix} {R_{SCET} = {{{kR}_{SCI}\frac{D_{SCI}}{D_{SCET}}} + {\left( {1 - k} \right)R_{SCEM}\frac{D_{SCEM}}{D_{SCET}}}}} & (6) \end{matrix}$

Functions as an approximation, for a white diffuser, since the illumination light incident onto the white diffuser is mainly from the whole internal wall of the sphere, the impact of the SCE port is small, thus D_(SCI)≈D_(SCET)≈D_(SCEM), and equation (6) becomes: R _(SCET) =kR _(SCI)+(1−k)R _(SCEM)  (7)

From equation (7), if the true SCE reflectance R_(SCET) and SCI reflectance R_(SCI) of a color standard, such as a black or grey ceramic tile, is known, then the value for the coefficient k can be obtained by measuring the reflectance value R_(SCEM) of the given standard.

In one or more configurations additional or multiple calibration standards can be used to calibrate the configuration described herein.

Turning to FIG. 6, each of these reference standards are measured by the integrating sphere 102 configured and described herein. As shown in step 216 and 218, this measurement of the calibration standard can be repeated for different calibration standards. For example, steps 216-218 are repeated for two or more gray scale standards with known reflectances. In a particular configuration, the processor 114 is configured to store the measured values obtained in steps 216-218 in the memory 105 or database 108 for further use. Since more than one measurement of the calibration standard will improve the accuracy, the measurement values obtained through successive iterations of steps 216-218 for different calibration standards can be solved according to: R _(SCET) =k ₁ R _(SCI) +k ₂ R _(SCEM)  (8)

Where k₁ and k₂ can be solved using the obtained measurements for the calibration standards, as well as the stored R_(SCET) values for the calibration standards.

Turning to step 212, upon either the accessing or deriving of the k values, the measurements of the sample 103 obtained in steps 202-206 can be used to generate the true R_(SCET) value of sample 103. More specifically, since the value for k is known or derived, R_(SCET) of any sample can be derived from its measured SCI reflectance R_(SCI) and measured SCE reflectance R_(SCEM) using equation (7).

For example, the processor 114 is configured by the corrected SCE measurement module 312, derives a corrected measurement for the SCE value using the obtained SCE and SCI measurements, as well as the accessed or derived coefficient values. For example, as in step 212, the processor 114 uses the SCI, SCE and the coefficient values k₁ and k₂ as inputs values to equation (8), solving and obtaining the CE reflectance R_(SCET).

Once obtained, the processor 114 is configured to output the R_(SCET) value and the SCI value to one of the display or a data storage device for further use as in step 214. For example, the processor 114 is configured by one or more output modules 314 to output the simultaneously measured SCE and SCI values, as well as the corrected SCE value to a user.

In accordance with the system, method and apparatus described herein, the simultaneous measurement of the SCE and SCI values of any sample can be obtained with higher accuracy compared to the existing devices utilizing integrating spheres. Such simultaneous measurement represents an improvement in the field of color measurement and operates to allow for more flexibility in the design and construction of integrating spheres and other color measurement technology. More specifically, the presently described measurement apparatus utilizes a SCE port that does not interfere with the SCI measurement and produces SCE measurements as accurate as ones taken under ideal SCE port dimensions. In a further configuration, the described approach represents a non-routine, customary and novel approach in the field of color measurement. Specifically, because the adjusted dimension SCE port does not impact SCI measurement the resulting SCI measurements values are more accurate.

The present approach further permits the SCE port size to be optimized, not for SCE measurement and placement but for overall design considerations. Specifically, since the SCE port size is not critical to the accuracy the measurement system described, the dimensions of the SCE port can be modified so as to permit other design considerations. For instance, the strict constraints placement and size of the SCE port 120 can be largely relaxed, and the overall system design becomes simpler. For instance, the SCE port of the described system is made smaller than in previous designs. With smaller SCE port, light leakage is reduced and the integrating sphere has improved general performance.

While this specification contains many specific embodiment details, these should not be construed as limitations on the scope of any embodiment or of what can be claimed, but rather as descriptions of features that can be specific to particular embodiments of particular embodiments. Certain features that are described in this specification in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable sub-combination. Moreover, although features can be described above as acting in certain combinations and even initially claimed as such, one or more features from a claimed combination can in some cases be excised from the combination, and the claimed combination can be directed to a sub-combination or variation of a sub-combination.

Similarly, while operations are depicted in the drawings in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed, to achieve desirable results. In certain circumstances, multitasking and parallel processing can be advantageous. Moreover, the separation of various system components in the embodiments described above should not be understood as requiring such separation in all embodiments, and it should be understood that the described program components and systems can generally be integrated together in a single software product or packaged into multiple software products.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the singular forms “a”, “an” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises” and/or “comprising”, when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

It should be noted that use of ordinal terms such as “first,” “second,” “third,” etc., in the claims to modify a claim element does not by itself connote any priority, precedence, or order of one claim element over another or the temporal order in which acts of a method are performed, but are used merely as labels to distinguish one claim element having a certain name from another element having a same name (but for use of the ordinal term) to distinguish the claim elements. Also, the phraseology and terminology used herein is for the purpose of description and should not be regarded as limiting. The use of “including,” “comprising,” or “having,” “containing,” “involving,” and variations thereof herein, is meant to encompass the items listed thereafter and equivalents thereof as well as additional items.

Particular embodiments of the subject matter described in this specification have been described. Other embodiments are within the scope of the following claims. For example, the actions recited in the claims can be performed in a different order and still achieve desirable results. As one example, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In certain embodiments, multitasking and parallel processing can be advantageous.

Publications and references to known registered marks representing various systems are cited throughout this application, the disclosures of which are incorporated herein by reference. Citation of any above publications or documents is not intended as an admission that any of the foregoing is pertinent prior art, nor does it constitute any admission as to the contents or date of these publications or documents. All references cited herein are incorporated by reference to the same extent as if each individual publication and references were specifically and individually indicated to be incorporated by reference.

While the invention has been particularly shown and described with reference to a preferred embodiment thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention. As such, the invention is not defined by the discussion that appears above, but rather is defined by the points that follow, the respective features recited in those points, and by equivalents of such features. 

The invention claimed is:
 1. A color measurement system comprising: an integrating sphere having at least one specular component included (SCI) sensor configured to output a signal in response to light incident thereupon, at least one specular component excluded (SCE) sensor configured to output a signal in response to light incident thereupon, a sample port, a SCE port, and a light source configured to direct a beam of light into the sphere and provide illumination at the sample port; a processor having a memory and configured to: activate the light source so as to cause a beam of light to be directed into the sphere and provide illumination to the sample port; receive a value output by the SCI sensor generated in response to light that has been reflected off a sample; receive a value output by the SCE sensor generated in response to light that has been reflected off a sample; obtain at least one measurement coefficient value; generate a corrected SCE measurement value using at least the SCI sensor output value, the SCE sensor output value and the at least one obtained measurement coefficient; and output at least the corrected SCE measurement value and the SCI sensor output value.
 2. The system of claim 1, wherein the SCE port has a diameter that is less than an ideal diameter for a SCE measurement port using the integrating sphere.
 3. The system of claim 1, wherein corrected SCE measurement value is generated according to: R _(SCET) =k ₁ R _(SCI) +k ₂ R _(SCEM) where, k₁ and k₂ are measurement coefficient values, R_(SCI) is the measurement signal obtained from the SCI sensor, and R_(SCEM) is the measurement signal obtained from the SCE measurement sensor.
 4. The system of claim 3, wherein k₂ is equal to 1-k₁.
 5. The system of claim 2, wherein the ideal diameter of the sample port intersects with an SCI effective area of the inner surface of the integrating sphere.
 6. The system of claim 1, wherein the at least one measurement coefficient value is obtained from a database or data storage device.
 7. The system of claim 1, wherein the at least one measurement coefficient is derived using one or more calibration standard having a known value.
 8. The system of claim 7, wherein the calibration standard having a known value are used to derive the calibration value according to: R _(SCET) =kR _(SCI)+(1−k)R _(SCEM) where R_(SCET) is the known SCE measurement value of the calibration standard, R_(SCEM) is the measured SCE signal, and R_(SCI) is the measured SCI value.
 9. The system of claim 7, wherein the measurement coefficient is derived using at least two calibration standards having known measurement values.
 10. A color measurement method comprising: obtaining from one specular component included (SCI) sensor configured to output a signal in response to light incident thereupon and at least one specular component excluded (SCE) sensor configured to output a signal in response to light incident thereupon, wherein the SCI sensor and the SCE sensor are both configured to measure light inside an integrating sphere, where the integrating sphere further includes a SCE port, obtaining at least one measurement coefficient value from a data storage location; generating a corrected SCE measurement value using at least the obtained SCI signal, the obtained SCE signal and the at least one measurement coefficient; and output at least the corrected SCE measurement value and the SCI measurement value.
 11. The method of claim 10, wherein the SCE port has a diameter that is less than an ideal diameter for SCE measurements using the integrating sphere.
 12. The system of claim 10, wherein generated corrected SCE measurement value is generated according to: R _(SCET) =k ₁ R _(SCI) +k ₂ R _(SCEM) Where, k₁ and k₂ are measurement coefficient values, R_(SCI) is the measurement signal obtained from the SCI sensor, and R_(SCEM) is the measurement signal obtained from the SCE measurement sensor.
 13. The method of claim 12, wherein k₂ is equal to 1−k₁.
 14. The method of claim 11, wherein the ideal diameter of the sample port intersects with an SCI effective area of the inner surface of the integrating sphere.
 15. The method of claim 10, wherein the at least one measurement coefficient value is obtained from a database or data storage device.
 16. The system of claim 10, wherein the at least one measurement coefficient is derived using one or more calibration standard having a known value.
 17. The system of claim 16, wherein the known color measurement values are used to derive the calibration value according to: R _(SCET) =kR _(SCI)+(1−k)R _(SCEM) where R_(SCET) is the known SCE measurement value of the calibration standard, R_(SCEM) is the measured SCE signal, and R_(SCI) is the measured SCI value.
 18. The system of claim 16, wherein the measurement coefficient is derived using at least two calibration standards having known measurement values.
 19. A computer program product embodied on a non-transitory computer readable-medium, comprising: computer code for obtaining from one specular component included (SCI) sensor configured to output a value in response to light incident thereupon; computer code for obtaining from at least one specular component excluded (SCE) sensor a signal in response to light incident thereupon, wherein the SCI sensor and the SCE sensor are both configured to measure light inside an integrating sphere, where the integrating sphere further includes a SCE port, computer code for receiving at least one measurement coefficient value from a data storage location; computer code for generating a corrected SCE measurement value using at least the obtained SCI signal, the obtained SCE signal and the at least one measurement coefficient; and computer code for outputting at least the corrected SCE measurement value and the SCI measurement value.
 20. The computer program of claim 19, further comprising code to generate the measurement coefficient according to: R _(SCET) =kR _(SCI)+(1−k)R _(SCEM) where R_(SCET) is the known SCE measurement value of a calibration standard, R_(SCEM) is the measured SCE signal of the known calibration standard, and R_(SCI) is the measured SCI value of the known calibration standard. 